XRD (X-ray Diffraction)


TX 2000 is the state of the art laboratory spectrometer for quantitative multi element trace analysis using principles of Total Reflection X-Ray Fluorescence (TXRF). TXRF, based on the same principles of traditional X-Ray Fluorescence (XRF), minimizes or totally eliminates matrix effect, allows simoultaneius multi-element ultra-trace analysis and pushes the instrumental detection limit down to ppb range from sodium to plutonium. TX 2000, equipped with an automatic primary beam switching system  (MoKa, WLa/Lb and bremsstrahlung 33 keV), a Silicon Drift Detector and an high power X-Ray Tube is the optimal solution for applications in environmental, chemicals and nuclear fields.