XRD (X-ray Diffraction)

 

TX 2000 is the state of the art laboratory spectrometer for quantitative multi element trace analysis using principles of Total Reflection X-Ray Fluorescence (TXRF). TXRF, based on the same principles of traditional X-Ray Fluorescence (XRF), minimizes or totally eliminates matrix effect, allows simoultaneius multi-element ultra-trace analysis and pushes the instrumental detection limit down to ppb range from sodium to plutonium. TX 2000, equipped with an automatic primary beam switching system  (MoKa, WLa/Lb and bremsstrahlung 33 keV), a Silicon Drift Detector and an high power X-Ray Tube is the optimal solution for applications in environmental, chemicals and nuclear fields. 

XRD (X-ray Diffraction)

 

Horizon is the new Benchtop Total Reflection X-Ray Fluorescence Spectrometer (TXRF) for multi elemental qualitative and quantitative analyses for major constituents and ultra-trace in suspension as well as liquid samples. Horizon is the state of the art of the Total Reflection X-Ray Fluorescence spectrometer and it is equipped with all the most modern technical components, which grant accuracy, precision, safety and easiness of use. TXRF, based on the same principles of traditional X-Ray Fluorescence (XRF), minimizes or totally eliminates matrix effect, allows simultaneous multi-element ultra-trace analysis and pushes the instrumental detection limit down to ppb range from sodium to plotonium.

XRD (X-ray Diffraction)

GNR Analytical Instrument offers equipment based on X-Ray Diffraction for measuring residual stress state and retained austenite content. Residual stress could be induced by machining, grinding, rolling, deep drawing, welding, thermal hardening and shot peening; its quantification allows to prevent fatigue damage and to control material’s durability and safety. X-Ray Diffraction is the conventional and time proven technique for measuring residual stress. Using the interatomic spacing as the ultimate gage length, the X-Ray technique is ideal for and applicable to crystalline materials, especially for metals, but also for ceramics. It measures the absolute stress without the need of an unstressed calibration sample. GNR StressX provides a flexible solution to residual stress determination on samples of any dimensions by the synergy between compact X-Ray diffractometer and 6-axis anthropomorphic robot.

XRD (X-ray Diffraction)

GNR SpiderX is a portable residual stress diffractometer. It has been designed focusing on the following specification: exceptional portability lightness, easiness to set up, outstanding performances and negligible X-Ray emissions. The result is a compact and smart instrument, based on a low power X-Ray tube and a fast and highly efficient detector, the combination of which ensures accurate and fast measurements. The head of the goniometer rotates along a curved sector of 90 degrees, for the determination of the stress status in polycristalline materials. The 2Theta angle can be changed from 135° to 165° in order to analyze Fe (ferrite, austenite), Al, Ni, Cu, Ti and Mg Alloys.

XRD (X-ray Diffraction)

AreX D is a state of the art X-Ray diffractometer equipped with the most modern technical features which grant accuracy, precision, safety and easiness of use, especially designed for the determination of Retained Austenite. AreX D has been conceived to be compliant with ASTM E 975-03 “Standard Practice for X-Ray Determination of Retained Austenite in Steel with Near Random Crystallographic Orientation”. ASTM E 975-03 norm requires to determine the concentration of retained austenite using XRD: four diffraction peaks are collected by the X-Ray diffractometer, two for the ferrite/martensite phase and two for the austenite phase. A comparison of the intensities of the 4 peaks yields the volume percent of retained austenite in the sample. The integrated intensities ratios of the austenite (200), (220) and (311), and the ferrite (200) and (211) diffraction peaks are calculated to verify the compliance with the requirement of 'Near Random Crystallographic Orientation'.

 

AreX D power is 50 Watt a low power X-Ray Tube making it doesn’t need cooling system.

XRD (X-ray Diffraction)

AreX L is a state of the art X-Ray diffractometer equipped with the most modern technical features which grant accuracy, precision, safety and easiness of use, especially designed for the determination of Retained Austenite. AreX L has been conceived to be compliant with ASTM E 975-03 “Standard Practice for X-Ray Determination of Retained Austenite in Steel with Near Random Crystallographic Orientation”. ASTM E 975-03 norm requires to determine the concentration of retained austenite using XRD: four diffraction peaks are collected by the X-Ray diffractometer, two for the ferrite/martensite phase and two for the austenite phase. A comparison of the intensities of the 4 peaks yields the volume percent of retained austenite in the sample. The integrated intensities ratios of the austenite (200), (220) and (311), and the ferrite (200) and (211) diffraction peaks are calculated to verify the compliance with the requirement of 'Near Random Crystallographic Orientation'.

3kW maximum power, 10-60kV and 5-60mA.

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XRD (X-ray Diffraction)

Explorer is a multi purpose - Theta/Theta - high resolution diffractometer which, thanks to its direct drive torque motors, offers top performances in many analytical areas, ranging from phase analysis to determination of microstructural properties on bulk or thin film materials. Thanks to its modularity and the wide range of accessories and attachments available, Explorer allows to perform measurements in different configurations: traditional X-Ray Powder Diffraction (XRPD), Reflectometry (XRR), Grazing Incidence Diffraction (GID), High Resolution X-Ray Diffraction (HRXRD), Total Reflection X-Ray Fluorescence (TXRF), Residual Stress and Texture X-Ray Diffraction.

XRD (X-ray Diffraction)

APD 2000 PRO diffractometer is an high power - Theta/2Theta - laboratory powder X-Ray Diffractometer equipped with all the most moder technical features which grant accuracy, precision, safety and easiness of use for XRD analysis of polycrystalline materials. 

Thanks to a wide offer of configurations and accessories such as high-speed detector, scintillation counter, high-low temperature and humiduty chamber, secondary monochromator, spinner and multiple sample holder, APD 2000 PRO is a powerful tool for powder diffraction applications such as routinary qualitative and quantitative phase analysis, non-ambient analysis, structure solution and refinement, crystallite size and degree of crystallinity calculation.

Its available in 3kW and 4kW.

XRD (X-ray Diffraction)

A benchtop general purpose diffractometer for XRD qualitative and quantitative analysis of polycrystalline materials. It is a Theta/Theta goniometer manufactured by GNR. Its compact size and robust design enables installation and operations in a small space and low cost of ownership and maintenance. Thanks to the wide offer of configurations and accessories, such as high speed detector, scintillation counter, secondary monochromator, spinner and multiple sample holder, Europe is the perfect instrument for fast-paced routine industrial quality assurance analysis and for teaching XRD at academic level. Its available in 600 Watt and 300 Watt

Optical Emission Spectrometer (OES)

ATLANTIS is an optic multi - detector, simultaneous, PC controlled spark emission spectrometer suitable for trace analysis of solid metallic samples. Atlantis can be equipped with full PMT and CMOS detectors. S9 Atlantis CMOS uses today’s most advanced linear CMOS detectors. These solid-state complementary metal oxide semiconductor devices are manufactured via proven integrated circuit detector technology. With CMOS, readout electronics perform analog-to-digital conversion and noise reduction on the chip itself. Results in exceptional dynamic range and higher data throughput.

S9 ATLANTIS also can be equipped with hybrid system combining between PMT and CMOS. With optical system of Paschen Runge mounting and Spectral: 120 to 900 nm that can be used to measure low Nitrogen and Oxygen. With Focal length 750 mm and vacuum system, the vacuum grade is provided by mean of a two-stage vacuum pump in series with high efficiency low noise.

Turbo molecular pump (option ) controlled by vacuum control device can be supplied for better detection in UV elements.

Optical Emission Spectrometer (OES)

S7 Metal Lab Plus combines ease of use and high accuracy of results. Its ergonomic and innovative design has been appreciated by many Laboratories using this Metal Analyzer for several applications across all metal industry. 

S7 MLP is the perfect solution able to cover multi matrix analysis requests and at the same time granting the flexibility of easy upgrade for future needs. S7 MLP is available with different configurations, able to analyze any different kind of metal alloys, ferrous and non ferrous ones: in addition an optional version with upgraded CMOS scientific grade is available for low nitrogen and oxygen analysis with superior analytical performances (Fe, Al, Cu, Ni, Ti, Mg, Sn, Pb, Co, Zn). 

As an option, S7 MLP could be set up with optional external arm with the aim to check bigger samples in ferrous and non ferrous alloys.

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Optical Emission Spectrometer (OES)

S5 SOLARIS CCD Plus (S5 SCP) is an advanced CMOS based optical emission spectrometer for Metal Analysis with vacuum tight optical chamber. S5 SCP offers the perfect solution for Metal Analysis: reliability and accuracy in results, superior analytical performance, ease of use and attractive price. With more than 600 units installed all over the world, S5 SCP is the most popular model of GNR range of spectrometer. S5 SCP represent the ideal solution to be used in any working place (Office, Laboratory, Stock, Production), thanks to the reduced dimensions and to the quality of components. GNR Technicians have introduced during the years several innovative and technological advanced solutions, which makes S5 SCP system fully suitable not only for general purpose applications but also for specific demands. S5 SCP instrument is offered as standard configuration as well as it can be easily customized in terms of optical parameters, different gratings and  detectors, elements and analytical range to fulfil the most strictly analytical demands. It is the perfect unit to perform multi-matrix analysis on both Ferrous and Not Ferrous Alloys (Fe, Al, Cu, Ni, Ti, Mg, Sn, Pb, Co, Zn). 

Optical Emission Spectrometer (OES)

S3 MiniLab 300 is the newest Spark Emission Spectrometer designed by GNR to celebrate its 30th year of operation. Nowadays MiniLab instruments are ones of the smallest and lightest compact optical emission spectrometers available on the market with outstanding analytical results in this category. S3 MiniLab 300 Spark Emission Spectrometer combines easiness of use, low maintenance cost, affordable price with the most advanced technological optical and electronic components.The optical emission spectrometer S3 MiniLab 300 is an optic multi-channels spectrometer suitable for the analysis of solid metallic samples and alloys in multi-matrices (Fe, Al, Cu, Ni, Ti, Mg, Sn, Pb, Co, Zn).Thanks to its innovative optical design, S3 Minilab 300 is the only spectrometer of its class to mount up to 7+1 high resolution CMOS with 4.096 elements to ensure the best spectral resolution (< 10pm). S3 Minilab 300 with its extended analytical range from 130 up to 700 nm can cover almost all the analytical requirements of a modern foundry include Nitrogen.

Optical Emission Spectrometer (OES)

An ultra compact optical emission spectrometer, introduce in 2014 in the market. It is a multi matrix spectrometer (Fe, Cu, Al, Ni, Zn, Sn). The innovative argon purged optic ensures the maximum light transparency. Nowadays MiniLab instruments are ones of the smallest and lightest compact optical emission spectrometers available on the market with outstanding analytical results in this category and hundreds of installation all over the world. Thanks to its innovative optical design, S1 Minilab 150 is the only spectrometer of its class to mount up to 4 high resolution CMOS with 4.096 elements to ensure the best spectral resolution (< 15pm). S1 Minilab 150 with its extended analytical range from 178 up to 460 nm can cover almost all the analytical requirements of a modern foundry, but not only.

PEC is a non-intrusive electromagnetic technique based on Pulsed Eddy Current which allows detection measurement and monitoring of corrosion in low alloyed carbon steel pipes and vessels through their insulations coatings, paints, concrete fire-proofing, marine growth. The PEC technology does not require direct contact, cleaning or special preparation of the surface of the object to be examined, therefore no costly and unnecessary insulation removal is required to perform the PEC examination with a considerable cost saving for the client.

PEC is the efficient and cost effective solution for the examination of insulated and corroded components and parts in the on- and off-shore industry and in the energy sector. Corrosion Under Insulation (CUI), Corrosion Under Fireproofing (CUF) and Flow Accelerated Corrosion (FAC) as well as Well Integrity are typical PEC successful applications, solutions and benefits. PEC performance are effective also for semi-contact measurements carried out with dirty, rough, cold and high temperature objects.

TRACER 5 family of portable XRF spectrometers

Handheld XRF for cutting-edge researchers; The TRACER 5 pXRF spectrometer; ideal for Methods Development, Research and Complex Materials.

TRACER 5 is the high value in-situ pXRF performer synchronizing power, function, precision and accuracy for dynamic, field capable laboratory-like elemental analysis.

The TRACER 5 family available in two (2) configurations: TRACER 5i and TRACER 5g. TRACER 5i have 8 um Be Window, Detects Na to U, Analyzes Mg to U. Ideal for art, archeology and advanced materials applications TRACER 5g have 1 um Graphene Window, Detects F to U (with He atmosphere), Analyses Na to U. Ideal for geosciences applications.

Contact our sales team to get more information about the products.

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